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Ultramicroscopy|November 23, 2007
3-D analysis of semiconductor dopant distributions in a patterned structure using LEAPJ S Moore, K S Jones, H Kennel, et al.Ultramicroscopy|November 24, 2007
Prospects for analyzing the electronic properties in nanoscale systems by VEELSRolf Erni, Sorin Lazar, Nigel D BrowningUltramicroscopy|March 22, 2007
Reliability of reconstructed beta-orientation maps in titanium alloysL Germain, N Gey, M HumbertUltramicroscopy|March 27, 2007
Simulation of sub-femtosecond response in laser-assisted field emissionM J Hagmann, M S MousaUltramicroscopy|April 3, 2007
The influence of relativistic energy losses on bandgap determination using valence EELSM Stöger-Pollach, P SchattschneiderUltramicroscopy|February 3, 2007
Automated three-dimensional X-ray analysis using a dual-beam FIBMiroslava Schaffer, Julian Wagner, Bernhard Schaffer, et al.Ultramicroscopy|March 21, 2007
Structure determination of tubular crystals of membrane proteins. IV. Distortion correction and its combined application with real-space averaging and solvent flatteningKoji Yonekura, Chikashi ToyoshimaUltramicroscopy|January 20, 2007
Towards automated diffraction tomography: part I--data acquisitionU Kolb, T Gorelik, C Kübel, et al.Ultramicroscopy|January 24, 2007
Application of a 2-beam model for improving the structure factors from precession electron diffraction intensitiesWharton Sinkler, Christopher S Own, Laurence D MarksUltramicroscopy|November 25, 2006
An algorithm for refinement of lattice parameters using CBED patternsA MorawiecPageof 460