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Ultramicroscopy|November 5, 2013
The post-peak spectra in electron energy loss near edge structureFeng Tian, Peter Schattschneider, Micheal Stoger-PollachUltramicroscopy|November 5, 2013
Micropattern of antibodies imaged by shear force microscopy: comparison between classical and jumping modesL González, J Otero, J P Agusil, et al.Ultramicroscopy|December 4, 2013
Height drift correction in non-raster atomic force microscopyTravis R Meyer, Dominik Ziegler, Christoph Brune, et al.Ultramicroscopy|August 24, 2013
Numerical simulation of Electron Energy Loss Spectroscopy using a Generalized Multipole TechniqueLars Kiewidt, Mirza Karamehmedović, Christian Matyssek, et al.Ultramicroscopy|August 13, 2013
Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic deviceF Iwata, Y Ohashi, I Ishisaki, et al.Ultramicroscopy|September 24, 2013
Orientation precision of TEM-based orientation mapping techniquesA Morawiec, E Bouzy, H Paul, et al.Ultramicroscopy|September 10, 2013
Is magnetic chiral dichroism feasible with electron vortices?P Schattschneider, S Löffler, M Stöger-Pollach, et al.Ultramicroscopy|August 15, 2013
Sensitivity of flexural vibration mode of the rectangular atomic force microscope micro cantilevers in liquid to the surface stiffness variationsAmir Farokh PayamUltramicroscopy|August 20, 2013
Application of scanning thermal microscopy for investigation of thermal boundaries in multilayered photonic structuresJ Juszczyk, M Krzywiecki, R Kruszka, et al.Pageof 460