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Ultramicroscopy
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March 31, 2012
Sub-nanometer free electrons with topological charge
P Schattschneider, M Stöger-Pollach, S Löffler, et al.
Ultramicroscopy
|
March 31, 2012
Structure projection reconstruction from through-focus series of high-resolution transmission electron microscopy images
Wei Wan, Sven Hovmöller, Xiaodong Zou
Ultramicroscopy
|
June 7, 2012
Measurement of elastic strains and small lattice rotations using electron back scatter diffraction
A J Wilkinson
Ultramicroscopy
|
June 7, 2012
Electron energy dependence of characteristics of fluorescent plates for ultrahigh-voltage electron microscopes
R Nishi, K Yoshida, A Takaoka, et al.
Ultramicroscopy
|
June 7, 2012
Wiener-filter enhancement of noisy HREM images
L D Marks
Ultramicroscopy
|
June 7, 2012
Reconstruction of the projected crystal potential from a periodic high-resolution electron microscopy exit plane wave function
M Lentzen, K Urban
Ultramicroscopy
|
June 7, 2012
Structure projection retrieval by image processing of HREM images taken under non-optimum defocus conditions
X Zou, M Sundberg, M Larine, et al.
Ultramicroscopy
|
April 28, 2012
Infrared microspectroscopy combined with conventional atomic force microscopy
B Kwon, M V Schulmerich, L J Elgass, et al.
Ultramicroscopy
|
April 28, 2012
Practical aspects of Boersch phase contrast electron microscopy of biological specimens
Andreas Walter, Heiko Muzik, Henning Vieker, et al.
Ultramicroscopy
|
May 9, 2012
Paraxial charge compensator for electron cryomicroscopy
John A Berriman, Peter B Rosenthal
Page
of 475
Search research articles
Search
Showing results (71-80 of 4,741) with videos related to
Sort By:
Page
of 475
Ultramicroscopy
|
March 31, 2012
Sub-nanometer free electrons with topological charge
P Schattschneider, M Stöger-Pollach, S Löffler, et al.
Ultramicroscopy
|
March 31, 2012
Structure projection reconstruction from through-focus series of high-resolution transmission electron microscopy images
Wei Wan, Sven Hovmöller, Xiaodong Zou
Ultramicroscopy
|
June 7, 2012
Measurement of elastic strains and small lattice rotations using electron back scatter diffraction
A J Wilkinson
Ultramicroscopy
|
June 7, 2012
Electron energy dependence of characteristics of fluorescent plates for ultrahigh-voltage electron microscopes
R Nishi, K Yoshida, A Takaoka, et al.
Ultramicroscopy
|
June 7, 2012
Wiener-filter enhancement of noisy HREM images
L D Marks
Ultramicroscopy
|
June 7, 2012
Reconstruction of the projected crystal potential from a periodic high-resolution electron microscopy exit plane wave function
M Lentzen, K Urban
Ultramicroscopy
|
June 7, 2012
Structure projection retrieval by image processing of HREM images taken under non-optimum defocus conditions
X Zou, M Sundberg, M Larine, et al.
Ultramicroscopy
|
April 28, 2012
Infrared microspectroscopy combined with conventional atomic force microscopy
B Kwon, M V Schulmerich, L J Elgass, et al.
Ultramicroscopy
|
April 28, 2012
Practical aspects of Boersch phase contrast electron microscopy of biological specimens
Andreas Walter, Heiko Muzik, Henning Vieker, et al.
Ultramicroscopy
|
May 9, 2012
Paraxial charge compensator for electron cryomicroscopy
John A Berriman, Peter B Rosenthal
Page
of 475