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Ultramicroscopy|January 21, 2015
Optimizing detector geometry for trace element mapping by X-ray fluorescenceYue Sun, Sophie-Charlotte Gleber, Chris Jacobsen, et al.
Ultramicroscopy|December 30, 2014
Automated CBED processing: sample thickness estimation based on analysis of zone-axis CBED patternM Klinger, M Němec, L Polívka, et al.
Ultramicroscopy|December 20, 2014
Towards weighing individual atoms by high-angle scattering of electronsG Argentero, C Mangler, J Kotakoski, et al.
Ultramicroscopy|December 3, 2014
Imaging of soft material with carbon nanotube tip using near-field scanning microwave microscopyZhe Wu, Wei-Qiang Sun, Tao Feng, et al.
Ultramicroscopy|October 15, 2014
Probing the crystallography of ordered Phases by coupling of orientation microscopy with atom probe tomographyS Meher, P Nandwana, T Rojhirunsakool, et al.
Ultramicroscopy|January 1, 1988
The reconstruction of helical particles with variable pitchD A Bluemke, B Carragher, R Josephs
Ultramicroscopy|November 7, 2020
Flat electron mirrorM A R Krielaart, P Kruit
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