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Ultramicroscopy|December 14, 2018
The atomic lensing model: New opportunities for atom-by-atom metrology of heterogeneous nanomaterialsK H W van den Bos, L Janssens, A De Backer, et al.
Ultramicroscopy|November 5, 2019
Coherence scanning interferometry allows accurate characterization of micrometric spherical particles contained in complex mediaRémy Claveau, Paul Montgomery, Manuel Flury
Ultramicroscopy|October 28, 2017
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparationTim Grieb, Moritz Tewes, Marco Schowalter, et al.
Ultramicroscopy|August 28, 2017
Imaging surface acoustic wave dynamics in semiconducting polymers by scanning ultrafast electron microscopyEbrahim Najafi, Bolin Liao, Timothy Scarborough, et al.
Ultramicroscopy|December 17, 2017
Studies of x-ray localization and thickness dependence in atomic-scale elemental mapping by STEM energy-dispersive x-ray spectroscopy using single-frame scanning methodPing Lu, Jaime M Moya, Renliang Yuan, et al.
Ultramicroscopy|December 18, 2017
Selective production of hydrogen ion species at atomically designed nanotipsHironori Moritani, Radovan Urban, Kyle Nova, et al.
Ultramicroscopy|May 14, 2022
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEMSatoko Toyama, Takehito Seki, Yuya Kanitani, et al.
Ultramicroscopy|July 24, 2021
Never retire: An introduction to the Baumeister- Humphreys-Spence--Urban birthday issueP W Hawkes
Ultramicroscopy|May 22, 2022
Event-based hyperspectral EELS: towards nanosecond temporal resolutionYves Auad, Michael Walls, Jean-Denis Blazit, et al.
Ultramicroscopy|July 4, 2021
Alignment of electron optical beam shaping elements using a convolutional neural networkE Rotunno, A H Tavabi, P Rosi, et al.
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