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Event-based hyperspectral EELS: towards nanosecond temporal resolution.

Yves Auad1, Michael Walls1, Jean-Denis Blazit1

  • 1Laboratoire des Physique des Solides, Université Paris Saclay, CNRS UMR 8502, Orsay, France.

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Summary
This summary is machine-generated.

We developed event-based hyperspectral electron energy loss spectroscopy (EELS) for faster imaging. This technique minimizes electron beam damage during scanning transmission electron microscopy, enabling real-time spectral data acquisition.

Keywords:
Electron energy-loss spectroscopyElectron microscopeEvent-basedHybrid pixel direct detectorTimepix3

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Area of Science:

  • Materials Science
  • Electron Microscopy
  • Spectroscopy

Background:

  • Hyperspectral imaging in scanning transmission electron microscopy (STEM) relates spatial electron probe position to spectral data.
  • Traditional frame-based electron energy loss spectroscopy (EELS) acquisition is slow, causing potential sample damage (e.g., electron irradiation) during data collection.

Purpose of the Study:

  • To develop an event-based hyperspectral EELS technique for faster image acquisition.
  • To enable hyperspectral imaging at rates comparable to single-channel detectors, mitigating sample damage.

Main Methods:

  • Utilized a Timepix3 detector with embedded time-to-digital converter (TDC) lines for event-based data acquisition.
  • Integrated scan unit (SU) reference signals with TDC events to reconstruct spectral images.
  • Achieved SU-limited scanning pixel dwell times for rapid data capture.

Main Results:

  • Demonstrated the ability to acquire hyperspectral images at the speed of single-channel detectors.
  • Successfully minimized undesirable sample effects like electron irradiation damage during acquisition.
  • Applied the technique to study calcite (CaCO3) decomposition into calcium oxide (CaO) and carbon dioxide (CO2) under electron beam irradiation.

Conclusions:

  • Event-based hyperspectral EELS offers a significant advancement in speed and sample preservation.
  • This method allows for real-time spectral imaging without compromising data quality or increasing acquisition time.
  • The technique provides new possibilities for studying dynamic processes in materials under electron irradiation.