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Ultramicroscopy|March 10, 2015
A new systematic framework for crystallographic analysis of atom probe dataVicente J Araullo-Peters, Andrew Breen, Anna V Ceguerra, et al.Ultramicroscopy|March 11, 2015
Quantification of oxide particle composition in model oxide dispersion strengthened steel alloysA J London, S Lozano-Perez, M P Moody, et al.Ultramicroscopy|April 13, 2015
Accurate membrane tracing in three-dimensional reconstructions from electron cryotomography dataChristopher Page, Dorit Hanein, Niels VolkmannUltramicroscopy|March 22, 2015
Improved Hilbert phase contrast for transmission electron microscopyPhilip J B KoeckUltramicroscopy|May 27, 2014
3D strain measurement in electronic devices using through-focal annular dark-field imagingSuhyun Kim, Younheum Jung, Sungho Lee, et al.Ultramicroscopy|January 22, 2014
Revolving scanning transmission electron microscopy: correcting sample drift distortion without prior knowledgeXiahan Sang, James M LeBeauUltramicroscopy|June 11, 2014
Electron microscopy of organic-inorganic interfaces: advantages of low voltageLawrence F DrummyUltramicroscopy|April 27, 2023
Random but limited pressure of graphene liquid cellsSota Hirokawa, Hideaki Teshima, Pablo Solís-Fernández, et al.Ultramicroscopy|May 19, 2023
GHz sample excitation at the ALBA-PEEMMuhammad Waqas Khaliq, José M Álvarez, Antonio Camps, et al.Ultramicroscopy|January 1, 1979
Electron diffraction studies of the peptidoglycan of bacterial cell wallsH Formanek, R RauscherPageof 460