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Ultramicroscopy|February 14, 2015
Aberration corrected Lorentz scanning transmission electron microscopyS McVitie, D McGrouther, S McFadzean, et al.
Ultramicroscopy|March 4, 2015
On the capability of in-situ exposure in an environmental scanning electron microscope for investigating the atmospheric corrosion of magnesiumM Esmaily, N Mortazavi, M Shahabi-Navid, et al.
Ultramicroscopy|April 27, 2021
Computer vision AC-STEM automated image analysis for 2D nanopore applicationsJoshua Chen, Adrian Balan, Paul Masih Das, et al.
Ultramicroscopy|August 29, 2012
A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and resultsR M Tromp, J B Hannon, W Wan, et al.
Ultramicroscopy|August 29, 2012
In-situ HRTEM study of the reactive carbide phase of Co/MoS2 catalystManuel Ramos, Domingo Ferrer, Eduan Martinez-Soto, et al.
Ultramicroscopy|May 13, 2023
Circular dichroism in hard X-ray photoelectron diffraction observed by time-of-flight momentum microscopyO Tkach, T-P Vo, O Fedchenko, et al.
Ultramicroscopy|May 15, 2023
An EBSD camera as a tool to characterise in-plane magnetisation vectors on Fe-Si (001) surfaceTomohito Tanaka, Kazuto Kawakami, Hisashi Mogi, et al.
Ultramicroscopy|February 18, 2015
Holography and coherent diffraction with low-energy electrons: A route towards structural biology at the single molecule levelTatiana Latychevskaia, Jean-Nicolas Longchamp, Conrad Escher, et al.
Ultramicroscopy|February 21, 2015
Estimation of dislocation density from precession electron diffraction data using the Nye tensorA C Leff, C R Weinberger, M L Taheri
Ultramicroscopy|February 21, 2015
Towards an optimum design for electrostatic phase platesAndreas Walter, Siegfried Steltenkamp, Sam Schmitz, et al.
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