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Ultramicroscopy|June 16, 2014
Analysis of electron beam damage of exfoliated MoS₂ sheets and quantitative HAADF-STEM imagingAlejandra Garcia, Andres M Raya, Marcelo M Mariscal, et al.Ultramicroscopy|April 4, 2015
On the origin of differential phase contrast at a locally charged and globally charge-compensated domain boundary in a polar-ordered materialIan MacLaren, LiQiu Wang, Damien McGrouther, et al.Ultramicroscopy|April 5, 2015
Spin resolved bandstructure imaging with a high resolution momentum microscopeChristian Tusche, Alexander Krasyuk, Jürgen KirschnerUltramicroscopy|August 3, 2020
Nanoscale mobility mapping in semiconducting polymer filmsA Alekseev, A Yedrissov, G J Hedley, et al.Ultramicroscopy|March 25, 2015
Rotation axes analysis of deformed magnesium based on rotation contour contrast in a scanning electron microscopeShirin Kaboli, Raynald GauvinUltramicroscopy|March 21, 2015
Concentration depth distribution of grain boundary segregation measured by wavelength dispersive X-ray spectroscopyWuqiang Yang, Min Xu, Huanhuan Bai, et al.Ultramicroscopy|January 1, 1978
Reconstruction of glutamine synthetase using computer averagingJ Frank, W Goldfarb, D Eisenberg, et al.Ultramicroscopy|November 13, 2012
Extraction of topographic and material contrasts on surfaces from SEM images obtained by energy filtering detection with low-energy primary electronsMasayasu Nagoshi, Tomohiro Aoyama, Kaoru SatoUltramicroscopy|November 13, 2012
Detector non-uniformity in scanning transmission electron microscopyS D Findlay, J M LeBeauUltramicroscopy|November 13, 2012
Rapid measurement of nanoparticle thickness profilesHadas Katz-Boon, Chris J Rossouw, Christian Dwyer, et al.Pageof 460