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Ultramicroscopy|September 19, 2025
Electron spin resonance spectroscopy in a transmission electron microscopeAntonín Jaroš, Johann Toyfl, Andrea Pupić, et al.Ultramicroscopy|August 14, 2021
Direct measurement of the PSF for Coulomb delocalization - a reconsiderationR F Egerton, A M Blackburn, R A Herring, et al.Ultramicroscopy|May 1, 2021
Manganese Migration in Li1-xMn2O4 Cathode MaterialsS Calderon V, R M Ribeiro, P J FerreiraUltramicroscopy|July 23, 2025
Approaching one nanosecond temporal resolution with square-wave-based control signals for interference gatingSimon Gaebel, Hüseyin Çelik, Dirk Berger, et al.Ultramicroscopy|July 2, 2025
EstimateNoiseSEM: A novel framework for deep learning based noise estimation of scanning electron microscopy imagesSheikh Shah Mohammad Motiur Rahman, Michel Salomon, Sounkalo DembéléUltramicroscopy|June 25, 2025
Valence EELS study of the composition of a liquid phase in a Janus Sn-Ge nanoparticle over a temperature range of 250-750 °COlha Khshanovska, Aleksandr KryshtalUltramicroscopy|June 25, 2025
Improving the elemental and imaging accuracy in atom probe tomography of (Ti,Si)N single and multilayer coatings using isotopic substitution of NSaeideh Naghdali, Maximilian Schiester, Helene Waldl, et al.Ultramicroscopy|July 16, 2025
Removing constraints of 4D-STEM with a framework for event-driven acquisition and processingArno Annys, Hoelen L Lalandec Robert, Saleh Gholam, et al.Ultramicroscopy|December 13, 2025
Validating electron pair distribution function analysis: The role of multiple scattering, beam, measurement, and processing parametersSangjun Kang, Hyeyoung Cho, Maximilian Töllner, et al.Ultramicroscopy|January 13, 2026
Exploring shaped focused ion beams for lamella preparationJohann Brenner, Jürgen M Plitzko, Sven KlumpePageof 460