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Ultramicroscopy|December 25, 2025
Angular resolution enhancement of electron backscatter diffraction patternsT Ben Britton, Tianbi ZhangUltramicroscopy|December 17, 2025
Basic considerations in the design of an electrostatic electron monochromatorM J Adriaans, J P Hoogenboom, A Mohammadi-GheidariUltramicroscopy|December 14, 2024
Enhancing subsurface imaging in ultrasonic atomic force microscopy with optimized contact forceMingyu Duan, Chengjian Wu, Jinyan Tang, et al.Ultramicroscopy|March 11, 2025
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holographyL Niermann, T Niermann, M LehmannUltramicroscopy|March 1, 2025
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimensRobert M GlaeserUltramicroscopy|August 29, 2024
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomographyBavley Guerguis, Ramya Cuduvally, Richard J H Morris, et al.Ultramicroscopy|November 3, 2024
A refined plan-view specimen preparation technique for high-quality electron microscopy studies of epitaxially grown atomically thin 2D layersA S Prikhodko, E Zallo, R Calarco, et al.Ultramicroscopy|August 13, 2024
Robust methodology for the EBSD local misorientation analysis of surface cold workIvan Bogachev, Kevin M Knowles, Grant J GibsonUltramicroscopy|June 20, 2024
Angular momentum transfer from swift electrons to non-spherical nanoparticles within the dipolar approximationJorge Luis Briseño-Gómez, Atzin López-Tercero, José Ángel Castellanos-Reyes, et al.Ultramicroscopy|October 23, 2023
Atom counting based on Voronoi averaged STEM intensities using a crosstalk correction schemeFlorian F Krause, Andreas RosenauerPageof 460