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Ultramicroscopy|March 28, 2024
Isolated scan unit and scanning tunneling microscope for stable imaging in ultra-high magnetic fieldsJihao Wang, Zihao Li, Kesen Zhao, et al.
Ultramicroscopy|September 8, 2023
Investigating the effects of solution viscosity on the stability and success rate of SECCM imagingQiangqiang Zheng, Jian Zhuang, Tianying Wang, et al.
Ultramicroscopy|January 13, 2024
Phase offset method of ptychographic contrast reversal correctionChristoph Hofer, Chuang Gao, Tamazouzt Chennit, et al.
Ultramicroscopy|January 5, 2024
Point field emission electron source with a magnetically focused electron beamPaweł Urbański, Piotr Szyszka, Marcin Białas, et al.
Ultramicroscopy|December 29, 2023
Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocompositesDavid Rutherford, Kateřina Kolářová, Jaroslav Čech, et al.
Ultramicroscopy|December 23, 2023
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detectionJosephine DeRonja, Matthew Nowell, Stuart Wright, et al.
Ultramicroscopy|December 12, 2023
Programmable comprehensive controller for multi-color 3D confocal spinning-disk image scanning microscopeEli Flaxer, Lanna Bram, Alona Flaxer, et al.
Ultramicroscopy|December 3, 2023
Noise-dependent bias in quantitative STEM-EMCD experiments revealed by bootstrappingHasan Ali, Jan Rusz, Daniel E Bürgler, et al.
Ultramicroscopy|December 6, 2023
Correlating electrochemical stimulus to structural change in liquid electron microscopy videos using the structural dissimilarity metricJustin T Mulvey, Katen P Iyer, Tomàs Ortega, et al.
Ultramicroscopy|December 7, 2023
"Depo-all-around": A novel FIB-based TEM specimen preparation technique for solid state battery composites and other loosely bound samplesThomas Demuth, Till Fuchs, Andreas Beyer, et al.
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