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Ultramicroscopy|December 8, 2023
Segmentability evaluation of back-scattered SEM images of multiphase materialsManolis Chatzigeorgiou, Vassilios Constantoudis, Marios Katsiotis, et al.
Ultramicroscopy|November 24, 2023
Momentum transfer resolved electron correlation microscopyShuoyuan Huang, Paul M Voyles
Ultramicroscopy|March 12, 2024
Measuring scattering distributions in scanning helium microscopyC J Hatchwell, M Bergin, B Carr, et al.
Ultramicroscopy|February 29, 2024
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matchingPatrick Trimby, Mohammed Al-Mosawi, Maisoon Al-Jawad, et al.
Ultramicroscopy|February 8, 2024
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensitiesLeonardo M Corrêa, Eduardo Ortega, Arturo Ponce, et al.
Ultramicroscopy|February 7, 2024
X-ray production cross sections for Ir and Bi M-subshells induced by electron impactM D Décima, G E Castellano, J C Trincavelli, et al.
Ultramicroscopy|May 17, 2024
Atomic force microscopy in mechanical measurements of single nanowiresBartosz C Pruchnik, Janusz D Fidelus, Ewelina Gacka, et al.
Ultramicroscopy|May 14, 2024
Fourier transform-based post-processing drift compensation and calibration method for scanning probe microscopyM Le Ster, S Pawłowski, I Lutsyk, et al.
Ultramicroscopy|May 15, 2024
A novel STM for quality atomic resolution with piezoelectric motor of high compactness and simplicityMuhammad Touqeer, Behnam Esmaeilzadeh, Wenjie Meng, et al.
Ultramicroscopy|May 28, 2024
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS dataHui Chen, Farhang Nabiei, James Badro, et al.
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