Vincent Goiffon

4PUBLICATIONS
12CO-AUTHORS
Lasers and quantum electronicsElectrical energy transmission, networks and systemsPlasma physics; fusion plasmas; electrical dischargesPhotonic and electro-optical devices, sensors and systems (excl. communications)
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Publications (4)

|Aug 10, 2024
Radiation Damage on Silicon Photomultipliers from Ionizing and Non-Ionizing Radiation of Low-Earth Orbit Operations.

Stefano Merzi, Fabio Acerbi, Corinne Aicardi

|Jan 01, 2020
Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage.

Alexandre Le Roch, Vincent Goiffon, Olivier Marcelot

|Dec 19, 2019
CMOS Image Sensors and Plasma Processes: How PMD Nitride Charging Acts on the Dark Current.

Yolène Sacchettini, Jean-Pierre Carrère, Romain Duru

|Dec 15, 2019
Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors.

Calvin Yi-Ping Chao, Shang-Fu Yeh, Meng-Hsu Wu

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Frequent Collaborators

2 joint publications

Olivier Marcelot

1 joint publications

Calvin Yi-Ping Chao

1 joint publications

Romain Duru

1 joint publications

Alexandre Le Roch