Calvin Yi-Ping Chao
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Publications (4)
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|Jan 10, 2026
High-Temperature Annealing of Random Telegraph Noise in a Stacked CMOS Image Sensor After Hot-Carrier Stress.Calvin Yi-Ping Chao, Thomas Meng-Hsiu Wu, Charles Chih-Min Liu
|Sep 28, 2023
Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor.Calvin Yi-Ping Chao, Thomas Meng-Hsiu Wu, Shang-Fu Yeh
|Dec 15, 2019
Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors.Calvin Yi-Ping Chao, Shang-Fu Yeh, Meng-Hsu Wu
|Nov 24, 2017
Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method.Calvin Yi-Ping Chao, Honyih Tu, Thomas Meng-Hsiu Wu
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