Shang-Fu Yeh

2PUBLICATIONS
1CO-AUTHORS
CryptographyPhotonic and electro-optical devices, sensors and systems (excl. communications)
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Publications (2)

|Jan 10, 2026
High-Temperature Annealing of Random Telegraph Noise in a Stacked CMOS Image Sensor After Hot-Carrier Stress.

Calvin Yi-Ping Chao, Thomas Meng-Hsiu Wu, Charles Chih-Min Liu

|Sep 28, 2023
Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor.

Calvin Yi-Ping Chao, Thomas Meng-Hsiu Wu, Shang-Fu Yeh

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2 joint publications

Calvin Yi-Ping Chao