Michael Jin

1PUBLICATIONS
3CO-AUTHORS
Electrical energy generation (incl. renewables, excl. photovoltaics)
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Publications (1)

|Apr 26, 2025
Analyzing the Impact of Gate Oxide Screening on Interface Trap Density in SiC Power MOSFETs Using a Novel Temperature-Triggered Method.

Monikuntala Bhattacharya, Michael Jin, Hengyu Yu

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Frequent Collaborators

1 joint publications

Monikuntala Bhattacharya

1 joint publications

Hengyu Yu

1 joint publications

Jiashu Qian