Hengyu Yu
3PUBLICATIONS
3CO-AUTHORS
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Publications (3)
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|Apr 26, 2025
Analyzing the Impact of Gate Oxide Screening on Interface Trap Density in SiC Power MOSFETs Using a Novel Temperature-Triggered Method.Monikuntala Bhattacharya, Michael Jin, Hengyu Yu
|Apr 13, 2024
Modeling of Charge-to-Breakdown with an Electron Trapping Model for Analysis of Thermal Gate Oxide Failure Mechanism in SiC Power MOSFETs.Jiashu Qian, Limeng Shi, Michael Jin
|Feb 24, 2024
An Investigation of Body Diode Reliability in Commercial 1.2 kV SiC Power MOSFETs with Planar and Trench Structures.Jiashu Qian, Limeng Shi, Michael Jin
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