Yahui Cai
3PUBLICATIONS
4CO-AUTHORS
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Publications (3)
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|Apr 17, 2025
A novel approach for detecting negative charge accumulation induced by electron beam irradiation using power MOSFET devices.Xianghe Fu, Yahui Cai, Wenjie Feng
|Nov 01, 2022
Erratum: "Measurement of total electron emission yield of insulators based on self-terminating charge neutralization" [Rev. Sci. Instrum. 93, 055103 (2022)].Yahui Cai, Dan Wang, Kangcheng Qi
|Jun 01, 2022
Measurement of total electron emission yield of insulators based on self-terminating charge neutralization.Yahui Cai, Dan Wang, Kangcheng Qi
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