Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Xianghe Fu

1PUBLICATIONS
3CO-AUTHORS
Electrical energy generation (incl. renewables, excl. photovoltaics)
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (1)

Sort by Publication Date:
|Apr 17, 2025
A novel approach for detecting negative charge accumulation induced by electron beam irradiation using power MOSFET devices.

Xianghe Fu, Yahui Cai, Wenjie Feng

Pageof 1

Frequent Collaborators

1 joint publications

Yahui Cai

1 joint publications

Dan Wang

1 joint publications

Yongning He

Frequent Collaborators

1 joint publications

Yahui Cai

1 joint publications

Dan Wang

1 joint publications

Yongning He

Top Related Videos

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on : Jul 30, 2013

13.0K
See more related videos

Top Related Videos

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on : Jul 30, 2013

13.0K
See more related videos