Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Zhifeng Cheng

4PUBLICATIONS
28CO-AUTHORS
Formal methods for softwarePhotogrammetry and remote sensingProcess control and simulation
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (4)

Sort by Publication Date:
|May 08, 2025
Advanced Simulation of ITER Core X-ray Crystal Spectroscopy.

Xinyi Jin, Zhifeng Cheng, Junli Zhang

|Jan 29, 2025
Performance characterization of x-ray crystal spectroscopy highly oriented pyrolytic graphite reflectors based on x-ray diffractometry experiments.

Dian Lu, Zhifeng Cheng, Tianlei Zhao

|Aug 06, 2024
Results from a synthetic model of the ITER XRCS-Core diagnostic based on high-fidelity x-ray ray tracing.

N A Pablant, Z Cheng, M O'Mullane

|Aug 03, 2022
Novel dual-reflection design applied for ITER core x-ray spectrometer.

Zhifeng Cheng, Amro Bader, Maarten De Bock

Pageof 1

Frequent Collaborators

4 joint publications

Novimir Pablant

3 joint publications

Lan Gao

3 joint publications

Raphael Tieulent

3 joint publications

Dian Lu

2 joint publications

Martin O'Mullane

2 joint publications

Yevgeniy Yakusevich

1 joint publications

Zhongyong Chen

1 joint publications

M Bitter

1 joint publications

E Bourcart

1 joint publications

L F Delgado-Aparicio

Frequent Collaborators

4 joint publications

Novimir Pablant

3 joint publications

Lan Gao

3 joint publications

Raphael Tieulent

3 joint publications

Dian Lu

Top Related Videos

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
06:46

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on : Aug 25, 2016

11.3K
High Pressure Single Crystal Diffraction at PX^2
11:32

High Pressure Single Crystal Diffraction at PX^2

Published on : Jan 16, 2017

21.4K
Microfluidic Chips for <em>In Situ</em> Crystal X-ray Diffraction and <em>In Situ</em> Dynamic Light Scattering for Serial Crystallography
11:48

Microfluidic Chips for <em>In Situ</em> Crystal X-ray Diffraction and <em>In Situ</em> Dynamic Light Scattering for Serial Crystallography

Published on : Apr 24, 2018

14.7K
See more related videos

Top Related Videos

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
06:46

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on : Aug 25, 2016

11.3K
High Pressure Single Crystal Diffraction at PX^2
11:32

High Pressure Single Crystal Diffraction at PX^2

Published on : Jan 16, 2017

21.4K
Microfluidic Chips for <em>In Situ</em> Crystal X-ray Diffraction and <em>In Situ</em> Dynamic Light Scattering for Serial Crystallography
11:48

Microfluidic Chips for <em>In Situ</em> Crystal X-ray Diffraction and <em>In Situ</em> Dynamic Light Scattering for Serial Crystallography

Published on : Apr 24, 2018

14.7K
See more related videos