Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Liang Yu

2PUBLICATIONS

4CO-AUTHORS

Satellite, space vehicle and missile design and testingHypersonic propulsion and hypersonic aerothermodynamics

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (2)

Sort by Publication Date:

|Dec 23, 2023

Development of a 3-DOF Angle Sensor Based on a Single Laser Interference Probe.

Liang Yu, Xingyang Feng, Pengcheng Hu

|Nov 25, 2023

A Two-Dimensional Precision Level for Real-Time Measurement Based on Zoom Fast Fourier Transform.

Haijin Fu, Zheng Wang, Xionglei Lin

Pageof 1

Frequent Collaborators

2 joint publications

Xionglei Lin

2 joint publications

Pengcheng Hu

1 joint publications

Haijin Fu

1 joint publications

Ruitao Yang

Frequent Collaborators

2 joint publications

Xionglei Lin

2 joint publications

Pengcheng Hu

1 joint publications

Haijin Fu

1 joint publications

Ruitao Yang

Top Related Videos

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on : Jun 13, 2023

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on : Jul 05, 2016

See more related videos

Top Related Videos

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on : Jun 13, 2023

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on : Jul 05, 2016

See more related videos