Ankur Sinha

2PUBLICATIONS
3CO-AUTHORS
Nanoscale characterisationPhysical properties of materials
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Publications (2)

|Feb 13, 2025
Rietveld Refinement of Electron Diffraction Patterns of Nanocrystalline Materials Using MAUD: Two-Beam Dynamical Correction Implementation and Applications.

Ankur Sinha, Valentino Abram, Luca Lutterotti

|Aug 17, 2022
Electron diffraction characterization of nanocrystalline materials using a Rietveld-based approach. Part I. Methodology.

Ankur Sinha, Mauro Bortolotti, Gloria Ischia

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Frequent Collaborators

1 joint publications

Mauro Bortolotti

1 joint publications

Valentino Abram

1 joint publications

Stefano Gialanella