Stefano Gialanella

1PUBLICATIONS
2CO-AUTHORS
Nanoscale characterisation
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Publications (1)

|Feb 13, 2025
Rietveld Refinement of Electron Diffraction Patterns of Nanocrystalline Materials Using MAUD: Two-Beam Dynamical Correction Implementation and Applications.

Ankur Sinha, Valentino Abram, Luca Lutterotti

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Frequent Collaborators

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Ankur Sinha

1 joint publications

Valentino Abram