Werner Egger

2PUBLICATIONS
10CO-AUTHORS
SynchrotronsPhotovoltaic power systems
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (2)

Sort by Publication Date:
|Feb 12, 2026
Defect Characterization of the SiO2/Si Interface Investigated by Drift-Assisted Positron Annihilation Lifetime Spectroscopy.

Ricardo Helm, Werner Egger, Catherine Corbel

|Aug 13, 2025
Defect Studies in Thin-Film SiO2 of a Metal-Oxide-Silicon Capacitor Using Drift-Assisted Positron Annihilation Lifetime Spectroscopy.

Ricardo Helm, Werner Egger, Catherine Corbel

Pageof 1

Frequent Collaborators

2 joint publications

Ricardo Helm

2 joint publications

Maik Butterling

2 joint publications

Andreas Wagner

2 joint publications

Maciej Oskar Liedke

2 joint publications

Johannes Mitteneder

2 joint publications

Michael Mayerhofer

2 joint publications

Kangho Lee

2 joint publications

Marcel Dickmann

1 joint publications

Georg S Duesberg

1 joint publications

Eric Hirschmann

Frequent Collaborators

2 joint publications

Ricardo Helm

2 joint publications

Maik Butterling

2 joint publications

Andreas Wagner

2 joint publications

Maciej Oskar Liedke

JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies
Jove
Visualize
Contact Us

Top Related Videos

Characterization of Amyloid Structures in Aging <em>C. Elegans</em> Using Fluorescence Lifetime Imaging
09:31

Characterization of Amyloid Structures in Aging <em>C. Elegans</em> Using Fluorescence Lifetime Imaging

Published on : Mar 27, 2020

7.7K
Light Enhanced Hydrofluoric Acid Passivation: A Sensitive Technique for Detecting Bulk Silicon Defects
09:15

Light Enhanced Hydrofluoric Acid Passivation: A Sensitive Technique for Detecting Bulk Silicon Defects

Published on : Jan 04, 2016

9.4K
See more related videos

Top Related Videos

Characterization of Amyloid Structures in Aging <em>C. Elegans</em> Using Fluorescence Lifetime Imaging
09:31

Characterization of Amyloid Structures in Aging <em>C. Elegans</em> Using Fluorescence Lifetime Imaging

Published on : Mar 27, 2020

7.7K
Light Enhanced Hydrofluoric Acid Passivation: A Sensitive Technique for Detecting Bulk Silicon Defects
09:15

Light Enhanced Hydrofluoric Acid Passivation: A Sensitive Technique for Detecting Bulk Silicon Defects

Published on : Jan 04, 2016

9.4K
See more related videos