Johannes Mitteneder
2PUBLICATIONS
10CO-AUTHORS
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Publications (2)
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|Feb 12, 2026
Defect Characterization of the SiO2/Si Interface Investigated by Drift-Assisted Positron Annihilation Lifetime Spectroscopy.Ricardo Helm, Werner Egger, Catherine Corbel
|Aug 13, 2025
Defect Studies in Thin-Film SiO2 of a Metal-Oxide-Silicon Capacitor Using Drift-Assisted Positron Annihilation Lifetime Spectroscopy.Ricardo Helm, Werner Egger, Catherine Corbel
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Frequent Collaborators
2 joint publications
Ricardo Helm
2 joint publications
Werner Egger
2 joint publications
Maik Butterling
2 joint publications
Andreas Wagner
2 joint publications
Maciej Oskar Liedke
2 joint publications
Michael Mayerhofer
2 joint publications
Kangho Lee
2 joint publications
Marcel Dickmann
1 joint publications
Georg S Duesberg
1 joint publications
Eric Hirschmann
