Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Tian-Li Wu

6PUBLICATIONS

7CO-AUTHORS

Electrical energy storageExperimental methods in fluid flow, heat and mass transferElemental semiconductorsElectrical energy generation (incl. renewables, excl. photovoltaics)

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (6)

Sort by Publication Date:

|May 04, 2026

Endurance Paradox in Hafnium-Oxide-Based Silicon-Channel Ferroelectric Transistors.

|Nov 27, 2025

Improve Intermetal Dielectric Process for HTRB Stability in Power GaN High Electron Mobility Transistor (HEMT) by unbiased-Highly Accelerated Stress Testing (uHAST).

Yu-Ting Chuang, Niall Tumilty, Tian-Li Wu

|Jul 29, 2023

Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO<sub>2</sub> Metal-Ferroelectric-Metal Memory.

Ting-Yu Chang, Kuan-Chi Wang, Hsien-Yang Liu

|May 18, 2023

Multiple-State Nonvolatile Memory Based on Ultrathin Indium Oxide Film via Liquid Metal Printing.

Chang-Hsun Huang, Chen-Yuan Weng, Kuan-Hung Chen

|Feb 25, 2023

Study on the Effects of Quantum Well Location on Optical Characteristics of AlGaN/GaN Light-Emitting HEMT.

Yao-Luen Shen, Chih-Yao Chang, Po-Liang Chen

|Feb 15, 2022

Enhancement of Ferroelectricity in 5 nm Metal-Ferroelectric-Insulator Technologies by Using a Strained TiN Electrode.

Cheng-Hung Wu, Kuan-Chi Wang, Yu-Yun Wang

Pageof 1

Frequent Collaborators

2 joint publications

Niall Tumilty

1 joint publications

Chih-Yao Chang

1 joint publications

Yuh-Renn Wu

1 joint publications

Yi-Chia Chou

1 joint publications

Hsien-Yang Liu

1 joint publications

Min-Hung Lee

1 joint publications

Sourav De

Frequent Collaborators

2 joint publications

Niall Tumilty

1 joint publications

Chih-Yao Chang

1 joint publications

Yuh-Renn Wu

1 joint publications

Yi-Chia Chou

Top Related Videos

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy

Published on : Apr 08, 2018

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased <em>a</em>-VO<sub><em>x</em></sub>

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased <em>a</em>-VO<sub><em>x</em></sub>

Published on : May 13, 2020

<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Published on : Jun 26, 2015

See more related videos

Top Related Videos

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy

Published on : Apr 08, 2018

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased <em>a</em>-VO<sub><em>x</em></sub>

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased <em>a</em>-VO<sub><em>x</em></sub>

Published on : May 13, 2020

<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Published on : Jun 26, 2015

See more related videos