Niall Tumilty

3PUBLICATIONS
3CO-AUTHORS
Electrical energy storageCircuits and systemsExperimental methods in fluid flow, heat and mass transfer
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Publications (3)

|May 04, 2026
Endurance Paradox in Hafnium-Oxide-Based Silicon-Channel Ferroelectric Transistors.

|Nov 27, 2025
Gate Metal Defect Screening at Wafer-Level for Improvement of HTGB in Power GaN HEMT.

Yu-Ting Chuang, Niall Tumilty

|Nov 27, 2025
Improve Intermetal Dielectric Process for HTRB Stability in Power GaN High Electron Mobility Transistor (HEMT) by unbiased-Highly Accelerated Stress Testing (uHAST).

Yu-Ting Chuang, Niall Tumilty, Tian-Li Wu

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Frequent Collaborators

2 joint publications

Tian-Li Wu

1 joint publications

Min-Hung Lee

1 joint publications

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