Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Filip Lenrick

2PUBLICATIONS

11CO-AUTHORS

Composite and hybrid materialsElectrical energy transmission, networks and systems

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (2)

Sort by Publication Date:

|Mar 25, 2024

Diffusion Bonding 321-Grade Stainless Steel: Failure and Multimodal Characterization.

Isac Lazar, Axel Knutsson, Hector Pous Romero

|Jun 13, 2020

Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction.

Dmitry Dzhigaev, Johannes Svensson, Abinaya Krishnaraja

Pageof 1

Frequent Collaborators

1 joint publications

Dmitry Dzhigaev

1 joint publications

Johannes Svensson

1 joint publications

Abinaya Krishnaraja

1 joint publications

Zhongyunshen Zhu

1 joint publications

Yi Liu

1 joint publications

Alexander Björling

1 joint publications

Susanna Hammarberg

1 joint publications

Jesper Wallentin

1 joint publications

Rainer Timm

1 joint publications

Lars-Erik Wernersson

Frequent Collaborators

1 joint publications

Dmitry Dzhigaev

1 joint publications

Johannes Svensson

1 joint publications

Abinaya Krishnaraja

1 joint publications

Zhongyunshen Zhu

Top Related Videos

Full-field Strain Measurements for Microstructurally Small Fatigue Crack Propagation Using Digital Image Correlation Method

Full-field Strain Measurements for Microstructurally Small Fatigue Crack Propagation Using Digital Image Correlation Method

Published on : Jan 16, 2019

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on : Jan 19, 2018

See more related videos

Top Related Videos

Full-field Strain Measurements for Microstructurally Small Fatigue Crack Propagation Using Digital Image Correlation Method

Full-field Strain Measurements for Microstructurally Small Fatigue Crack Propagation Using Digital Image Correlation Method

Published on : Jan 16, 2019

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on : Jan 19, 2018

See more related videos