George Angelov

5PUBLICATIONS
7CO-AUTHORS
Nonlinear optics and spectroscopyEngineering electromagneticsPhotonics, optoelectronics and optical communicationsElemental semiconductors
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Publications (5)

|May 13, 2026
Study of Dangling Bond States in Magnetron-Sputtered a-Si Thin Films via Parametrization Using a Single UV-Vis-NIR Transmittance Spectrum.

|May 12, 2026
High-Accuracy Characterization of a Single Thin Film on a Substrate from One Transmittance Spectrum by an Advanced Envelope Method Addressing Voids, Tail Electron Transitions, and Deep-Level Electron Transitions in a-Si Films.

|Sep 09, 2023
Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample.

Dorian Minkov, George Angelov, Emilio Marquez

|Dec 11, 2022
Hybrid Dispersion Model Characterization of PAZO Azopolymer Thin Films over the Entire Transmittance Spectrum Measured in the UV/VIS/NIR Spectral Region.

Dorian Minkov, Lian Nedelchev, George Angelov

|Aug 27, 2021
Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum.

Dorian Minkov, Emilio Marquez, George Angelov

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Frequent Collaborators

5 joint publications

Dorian Minkov

4 joint publications

Susana Ruano

2 joint publications

Dimitar Nikolov

2 joint publications

Manuel Ballester