Dorian Minkov
6PUBLICATIONS
7CO-AUTHORS

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Publications (6)
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|Sep 09, 2023
Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample.Dorian Minkov, George Angelov, Emilio Marquez
|Dec 11, 2022
Hybrid Dispersion Model Characterization of PAZO Azopolymer Thin Films over the Entire Transmittance Spectrum Measured in the UV/VIS/NIR Spectral Region.Dorian Minkov, Lian Nedelchev, George Angelov
|Aug 27, 2021
Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum.Dorian Minkov, Emilio Marquez, George Angelov
|Jul 09, 2020
Optical Characterization of AsxTe100-x Films Grown by Plasma Deposition Based on the Advanced Optimizing Envelope Method.Dorian Minkov, George Angelov, Radi Nestorov
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