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Bayartulga Ishdorj, Jeongyeon Kim, Jae Hwan Kim
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on : Jan 19, 2018
In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased <em>a</em>-VO<sub><em>x</em></sub>
Published on : May 13, 2020
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on : Jan 19, 2018
In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased <em>a</em>-VO<sub><em>x</em></sub>
Published on : May 13, 2020