Joe Salfi
3PUBLICATIONS
16CO-AUTHORS
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Publications (3)
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|Jun 09, 2020
Scanned Single-Electron Probe inside a Silicon Electronic Device.Kevin S H Ng, Benoit Voisin, Brett C Johnson
|Dec 13, 2018
Readout and control of the spin-orbit states of two coupled acceptor atoms in a silicon transistor.Joost van der Heijden, Takashi Kobayashi, Matthew G House
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Frequent Collaborators
1 joint publications
Joost van der Heijden
1 joint publications
Takashi Kobayashi
1 joint publications
Matthew G House
1 joint publications
Michelle Y Simmons
1 joint publications
Sven Rogge
1 joint publications
Arne Laucht
1 joint publications
Frank Hohls
1 joint publications
Søren Stobbe
1 joint publications
Tim Schröder
1 joint publications
Ferdinand Kuemmeth
