Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Benoît Beausir

1PUBLICATIONS
4CO-AUTHORS
Electrical circuits and systems
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (1)

Sort by Publication Date:
|Jan 13, 2025
Estimation of Dislocation Densities With Nondestructive Scanning Electron Microscope Techniques: Application to Gallium Nitride.

Arka Mandal, Benoît Beausir, Julien Guyon

Pageof 1

Frequent Collaborators

1 joint publications

Arka Mandal

1 joint publications

Julien Guyon

1 joint publications

Vincent Taupin

1 joint publications

Antoine Guitton

Frequent Collaborators

1 joint publications

Arka Mandal

1 joint publications

Julien Guyon

1 joint publications

Vincent Taupin

1 joint publications

Antoine Guitton

Top Related Videos

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
07:10

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry

Published on : Apr 29, 2020

1.6K
See more related videos

Top Related Videos

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
07:10

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry

Published on : Apr 29, 2020

1.6K
See more related videos