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Chabum Lee

2PUBLICATIONS

7CO-AUTHORS

Nonlinear optics and spectroscopyElectronic device and system performance evaluation, testing and simulation

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Publications (2)

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|Apr 14, 2026

Atomic force microscopy (AFM) tip metrology and inspection by knife edge diffractometry.

Kuan Lu, Pengfei Lin, Hyeonho Cho

|Jul 14, 2023

A differentially amplified Hall effect displacement sensor for positioning control of a long-range flexure stage.

William Park, Heebum Chun, Phuc Nguyen

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Frequent Collaborators

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William Park

1 joint publications

Heebum Chun

1 joint publications

Phuc Nguyen

1 joint publications

Kuan Lu

1 joint publications

Pengfei Lin

1 joint publications

Hyeonho Cho

1 joint publications

Sunghan Kim

Frequent Collaborators

1 joint publications

William Park

1 joint publications

Heebum Chun

1 joint publications

Phuc Nguyen

1 joint publications

Kuan Lu

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