Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Naresh Kumar Emani

2PUBLICATIONS
2CO-AUTHORS
Photovoltaic power systemsNanophotonics
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (2)

Sort by Publication Date:
|Sep 22, 2022
Tunable directional emission from electrically driven nano-strip metal-insulator-metal tunnel junctions.

Saurabh Kishen, Jinal Tapar, Naresh Kumar Emani

|Aug 22, 2018
Directional lasing in resonant semiconductor nanoantenna arrays.

Son Tung Ha, Yuan Hsing Fu, Naresh Kumar Emani

Pageof 1

Frequent Collaborators

1 joint publications

Ramón Paniagua-Domínguez

1 joint publications

Saurabh Kishen

Frequent Collaborators

1 joint publications

Ramón Paniagua-Domínguez

1 joint publications

Saurabh Kishen

Top Related Videos

Scalable Quantum Integrated Circuits on Superconducting Two-Dimensional Electron Gas Platform
05:39

Scalable Quantum Integrated Circuits on Superconducting Two-Dimensional Electron Gas Platform

Published on : Aug 02, 2019

9.7K
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on : May 28, 2016

14.4K
See more related videos

Top Related Videos

Scalable Quantum Integrated Circuits on Superconducting Two-Dimensional Electron Gas Platform
05:39

Scalable Quantum Integrated Circuits on Superconducting Two-Dimensional Electron Gas Platform

Published on : Aug 02, 2019

9.7K
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on : May 28, 2016

14.4K
See more related videos