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Bastien Bonef, Rushabh D Shah, Kunal Mukherjee
Bastien Bonef, Hervé Boukari, Adeline Grenier
Bastien Bonef, Miguel Lopez-Haro, Lynda Amichi

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on : May 28, 2016

Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe<sub>1+</sub><em><sub>Y</sub></em>Te Using a Spin-polarized Scanning Tunneling Microscope
Published on : Mar 24, 2019

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
Published on : Jul 05, 2016