Semiconductors
Diffusion
Diffusion
Law of Segregation
Types of Semiconductors
Segregation in Fresh Concrete
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jan 29, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Bastien Bonef1, Rushabh D Shah2, Kunal Mukherjee1
1Materials Department , University of California , Santa Barbara , California 93106 , United States.
Understanding threading dislocations in semiconductor heterostructures is key for advanced electronics. This study reveals unique compositional changes around dislocations, impacting device performance and reliability.
06:57Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
Published on: July 17, 2020
15:10From Fast Fluorescence Imaging to Molecular Diffusion Law on Live Cell Membranes in a Commercial Microscope
Published on: October 9, 2014
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: