Surajit Chakraborty
5PUBLICATIONS
2CO-AUTHORS

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Publications (5)
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|Oct 28, 2023
Reliability Assessment of On-Wafer AlGaN/GaN HEMTs: The Impact of Electric Field Stress on the Mean Time to Failure.Surajit Chakraborty, Tae-Woo Kim
|Sep 28, 2023
Effect of Trap Behavior on the Reliability Instability of Metamorphic Buffer in InAlAs/InGaAs MHEMT on GaAs.Ki-Yong Shin, Ju-Won Shin, Walid Amir
|Jun 28, 2023
Impact of Charge-Trapping Effects on Reliability Instability in AlxGa1-xN/GaN High-Electron-Mobility Transistors with Various Al Compositions.Walid Amir, Surajit Chakraborty, Hyuk-Min Kwon
|Dec 11, 2022
Explicit Thermal Resistance Model of Self-Heating Effects of AlGaN/GaN HEMTs with Linear and Non-Linear Thermal Conductivity.Surajit Chakraborty, Walid Amir, Ju-Won Shin
|Jan 21, 2022
Comprehensive Schottky Barrier Height Behavior and Reliability Instability with Ni/Au and Pt/Ti/Pt/Au on AlGaN/GaN High-Electron-Mobility Transistors.Surajit Chakraborty, Tae-Woo Kim
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