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Comprehensive Schottky Barrier Height Behavior and Reliability Instability with Ni/Au and Pt/Ti/Pt/Au on AlGaN/GaN

Surajit Chakraborty1, Tae-Woo Kim1

  • 1Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan 44610, Korea.

Micromachines
|January 21, 2022
PubMed

Keywords:
AlGaN/GaNSchottky barrier heightcritical voltagedegradationhigh temperatureinverse piezoelectric effectoff-state stressreliability instability

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