Tobias Erlbacher
2PUBLICATIONS
7CO-AUTHORS
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Publications (2)
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|Jan 11, 2022
Mechanisms of Ohmic Contact Formation of Ti/Al-Based Metal Stacks on p-Doped 4H-SiC.Matthias Kocher, Mathias Rommel, Paweł Piotr Michałowski
|Oct 15, 2020
The impact of dislocations on AlGaN/GaN Schottky diodes and on gate failure of high electron mobility transistors.Sven Besendörfer, Elke Meissner, Farid Medjdoub
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