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David Kitsche, Yushu Tang, Hendrik Hemmelmann
Jonas Hertle, Felix Walther, Teo Lombardo
Jürgen Janek
Holger Schneider
Marcus Rohnke
David Kitsche
Yushu Tang
Hendrik Hemmelmann
Matteo Bianchini
Aleksandr Kondrakov
Torsten Brezesinski

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
Published on : Jun 27, 2022

Screening of Coatings for an All-Solid-State Battery Using <em>In Situ</em> Transmission Electron Microscopy
Published on : Jan 20, 2023