Hang Xu
4PUBLICATIONS
4CO-AUTHORS
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Publications (4)
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|Dec 19, 2025
Analysis of gate oxide instability of SiC MOSFETs under ultra-high gate voltage pulse stress.Jingjing Tan, Hang Xu, Jianbin Guo
|Nov 27, 2025
Temperature-Dependent Reverse-Recovery Behavior Analysis and Circuit-Level Mitigation of Superjunction MOSFETs.Wenrong Cui, Peng Liao, Yanghao Wang
|Jun 27, 2024
A Novel High-Speed Split-Gate Trench Carrier-Stored Trench-Gate Bipolar Transistor with Enhanced Short-Circuit Roughness.Zhehong Qian, Wenrong Cui, Tianyang Feng
|May 27, 2023
A Performance Optimized CSTBT with Low Switching Loss.Hang Xu, Tianyang Feng, Wenrong Cui
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