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Dražen Radić, Martin Peterlechner, Matthias Posselt
Dražen Radić, Martin Peterlechner, Katharina Spangenberg
Dražen Radić, Martin Peterlechner, Matthias Posselt
Dražen Radić, Martin Peterlechner, Hartmut Bracht
Dražen Radić, Sven Hilke, Martin Peterlechner

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on : May 28, 2016

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
Published on : Jul 17, 2020

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments
Published on : Jun 27, 2022