Samuel M Stavis

7PUBLICATIONS
10CO-AUTHORS
NanochemistryPhotogrammetry and remote sensingNonlinear optics and spectroscopyMicro-manipulation
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Publications (7)

|Aug 18, 2026
Measurement Error Models Enable Accurate Correlation of Nanoscale Properties and Structures.

|May 14, 2024
Traceable localization enables accurate integration of quantum emitters and photonic structures with high yield.

Craig R Copeland, Adam L Pintar, Ronald G Dixson

|Dec 20, 2021
Sub-picoliter Traceability of Microdroplet Gravimetry and Microscopy.

Lindsay C C Elliott, Adam L Pintar, Craig R Copeland

|Jun 25, 2021
Accurate localization microscopy by intrinsic aberration calibration.

Craig R Copeland, Craig D McGray, B Robert Ilic

|May 17, 2019
Particle Tracking of Microelectromechanical System Performance and Reliability.

Craig R Copeland, Craig D McGray, Jon Geist

|Mar 07, 2019
Subnanometer localization accuracy in widefield optical microscopy.

Craig R Copeland, Jon Geist, Craig D McGray

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Frequent Collaborators

7 joint publications

Craig R Copeland

3 joint publications

Adam L Pintar

2 joint publications

B Robert Ilic

2 joint publications

Andrew C Madison