Wen Hsin Chang

3PUBLICATIONS
16CO-AUTHORS
Wireless communication systems and technologies (incl. microwave and millimetrewave)Photovoltaic power systemsElemental semiconductors
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (3)

Sort by Publication Date:
|Mar 09, 2026
Contact engineering of metallic Ni-integrated niobium sulfide via H2S treatment for enhanced MoS2 transistor performance and CMOS compatibility.

Koki Hori, Wen Hsin Chang, Toshifumi Irisawa

|Sep 29, 2025
Structural and Electric Characterization of Sputtered Pt/WSe2 Contacts toward High-Performance 2D p‑FETs.

Ryuichi Nakajima, Tomonori Nishimura, Kaito Kanahashi

|Apr 06, 2023
Discovery of a metastable van der Waals semiconductor via polymorphic crystallization of an amorphous film.

Yuta Saito, Shogo Hatayama, Wen Hsin Chang

Pageof 1

Frequent Collaborators

2 joint publications

Yuta Saito

2 joint publications

Shogo Hatayama

2 joint publications

Naoya Okada

2 joint publications

Toshifumi Irisawa

1 joint publications

Fumihiko Uesugi

1 joint publications

Masaki Takeguchi

1 joint publications

Yuji Sutou

1 joint publications

Paul Fons

1 joint publications

Tomonori Nishimura

1 joint publications

Kaito Kanahashi

Frequent Collaborators

2 joint publications

Yuta Saito

2 joint publications

Shogo Hatayama

2 joint publications

Naoya Okada

2 joint publications

Toshifumi Irisawa

JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies
Jove
Visualize
Contact Us

Top Related Videos

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on : Dec 05, 2015

12.8K
Atomic Layer Deposition of Vanadium Dioxide and a Temperature-dependent Optical Model
11:10

Atomic Layer Deposition of Vanadium Dioxide and a Temperature-dependent Optical Model

Published on : May 23, 2018

12.0K
See more related videos

Top Related Videos

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on : Dec 05, 2015

12.8K
Atomic Layer Deposition of Vanadium Dioxide and a Temperature-dependent Optical Model
11:10

Atomic Layer Deposition of Vanadium Dioxide and a Temperature-dependent Optical Model

Published on : May 23, 2018

12.0K
See more related videos