Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Mohammad Rashidi

4PUBLICATIONS
2CO-AUTHORS
Micro- and nanosystemsMolecular and organic electronics
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (4)

Sort by Publication Date:
|Jul 25, 2018
Lithography for robust and editable atomic-scale silicon devices and memories.

Roshan Achal, Mohammad Rashidi, Jeremiah Croshaw

|May 24, 2018
Autonomous Scanning Probe Microscopy in Situ Tip Conditioning through Machine Learning.

Mohammad Rashidi, Robert A Wolkow

|Nov 02, 2017
Resolving and Tuning Carrier Capture Rates at a Single Silicon Atom Gap State.

Mohammad Rashidi, Erika Lloyd, Taleana R Huff

|Oct 27, 2016
Time-resolved single dopant charge dynamics in silicon.

Mohammad Rashidi, Jacob A J Burgess, Marco Taucer

Pageof 1

Frequent Collaborators

1 joint publications

Taleana R Huff

1 joint publications

Robert A Wolkow

Frequent Collaborators

1 joint publications

Taleana R Huff

1 joint publications

Robert A Wolkow

Top Related Videos

Fabrication and Characterization of Thickness Mode Piezoelectric Devices for Atomization and Acoustofluidics
10:39

Fabrication and Characterization of Thickness Mode Piezoelectric Devices for Atomization and Acoustofluidics

Published on : Aug 05, 2020

7.4K
Probing C<sub>84</sub>-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
13:58

Probing C<sub>84</sub>-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Published on : Sep 28, 2016

12.3K
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on : Jan 19, 2018

10.3K
See more related videos

Top Related Videos

Fabrication and Characterization of Thickness Mode Piezoelectric Devices for Atomization and Acoustofluidics
10:39

Fabrication and Characterization of Thickness Mode Piezoelectric Devices for Atomization and Acoustofluidics

Published on : Aug 05, 2020

7.4K
Probing C<sub>84</sub>-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
13:58

Probing C<sub>84</sub>-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Published on : Sep 28, 2016

12.3K
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on : Jan 19, 2018

10.3K
See more related videos