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Updated: Feb 10, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Mohammad Rashidi1,2, Robert A Wolkow1,2,3
1Department of Physics , University of Alberta , Edmonton , Alberta T6G 2J1 , Canada.
We developed machine learning methods to automatically check and fix scanning tunneling microscope probes. This ensures accurate atomic-scale characterization and manipulation for advanced materials science research.
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