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Sebastian Hofer

4PUBLICATIONS
12CO-AUTHORS
CeramicsCrystallographyCompound semiconductorsOrganic semiconductors
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Journal

Publications (4)

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|Jul 01, 2022
Impact of sample misalignment on grazing incidence x-ray diffraction patterns and the resulting unit cell determination.

Valentin Holzer, Benedikt Schrode, Josef Simbrunner

|Aug 25, 2021
<i>GIDInd</i>: an automated indexing software for grazing-incidence X-ray diffraction data.

Manuel Peter Kainz, Lukas Legenstein, Valentin Holzer

|Jul 02, 2021
Mobility anisotropy in the herringbone structure of asymmetric Ph-BTBT-10 in solution sheared thin film transistors.

Adrián Tamayo, Sebastian Hofer, Tommaso Salzillo

|Apr 19, 2019
Indexing grazing-incidence X-ray diffraction patterns of thin films: lattices of higher symmetry.

Josef Simbrunner, Sebastian Hofer, Benedikt Schrode

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Frequent Collaborators

4 joint publications

Roland Resel

2 joint publications

Benedikt Schrode

1 joint publications

Stefan Hecht

1 joint publications

Ingo Salzmann

1 joint publications

Adrián Tamayo

1 joint publications

Tommaso Salzillo

1 joint publications

Guillaume Schweicher

1 joint publications

Marta Mas-Torrent

1 joint publications

Lukas Legenstein

1 joint publications

Martin Kaltenegger

Frequent Collaborators

4 joint publications

Roland Resel

2 joint publications

Benedikt Schrode

1 joint publications

Stefan Hecht

1 joint publications

Ingo Salzmann

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