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Andrew J Gayle, Lawrence H Friedman, Ryan Beams+5
Robert F Cook, Frank W DelRio, Brad L Boyce
Robert F Cook, Frank W DelRio
R F Cook, F W DelRio
Frank W DelRio
Lawrence H Friedman
Chris A Michaels
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on : May 28, 2016
Determining the Mechanical Strength of Ultra-Fine-Grained Metals
Published on : Nov 22, 2021